The Chinese part of the EMC test series describing emission and immunity testing in transverse electromagnetic waveguides is used in China mainly by the electronics industry during development, where the compact cell is an economical substitute for a fully anechoic chamber, and by the component and module suppliers who must demonstrate the performance of a subassembly before it is integrated into a larger product. The requirement reaches a manufacturer through the Chinese product standards for information technology equipment and for household appliances, which accept the cell method provided that the field uniformity over the test volume has been verified and recorded. Because the majority of Chinese EMC laboratories are equipped with cells of one kind or another, the method is encountered far more often in Chinese test reports than the corresponding chamber method, and the entry is included so that a foreign manufacturer can identify the Chinese designation under which a domestic laboratory will report the result.